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 6116A: 11/8/89 Revision: Monday, November 8, 1993
Features
D D D D D D D
Automatic power down when deselected CMOS for optimum speed/power High speed 20 ns Low active power 550 mW Low standby power 110 mW TTL compatible inputs and outputs Capable of withstanding greater than 2001V electrostatic discharge
The CY6116A and CY6117A are high performance CMOS static RAMs orga nized as 2048 words by 8 bits. Easy memoryexpansionisprovidedbyanactive LOW chip enable (CE) and active LOW output enable (OE), and three state driv ers. The CY6116A and CY6117A have an automatic power down feature, reducing the power consumption by 83% when de selected. Writingtothedeviceisaccomplishedwhen the chip enable (CE) and write enable (WE) inputs are both LOW. Data on the I/Opins(I/O0 throughI/O7)iswritteninto
Functional Description
the memory location specified on the ad dress pins (A0 through A10). Readingthedeviceisaccomplishedbytak ing chip enable (CE) and output enable (OE) LOW while write enable (WE) re mainsHIGH.Undertheseconditions,the contents of the memory location specified on the address pins will appear on the I/O pins. The I/O pins remain in high impedance state when chip enable (CE) is HIGH or write enable (WE) is LOW. The CY6116A and CY6117A utilize a die coat to insure alpha immunity.
2K x 8 Static RAM
CY6116A CY6117A
Logic Block Diagram
A7 A6 A5 A4 A3 A2 A1 1 2 3 4 5 6 7 8 9 10 11 12 6116A
Pin Configurations
DIP/SOJ Top View
24 23 22 21 20 19 18 17 16 15 14 13 VCC A8 A9 WE OE A10 CE I/O7 I/O6 I/O5 I/O4 I/O3 A3 A2 NC NC A1 A0 I/O0 5 6 7 8 9 10 11 6116A 4 A4 A7 V CC
LCC Top View
A8 3 2 1 28 27 26 25 24 23 22 21 20 19 1213 14 151617 18 1 I/O 2 GND I/O 3 I/O 4 I/O 5 I/O 6 WE OE A10 NC NC CE I/O7 A9 6116A-3 A5 A6
I/O0
INPUT BUFFER
A0 I/O0 I/O1
GND ROW DECODER
A9 A8 A7 A6 A5 A4
I/O2
SENSE AMPS
6116A-2
128 x 16 x 8 ARRAY
I/O3
NC
NC
NC
NC
I/O5
4 A6 A5 A4 A3 A2 5 6 7 8 9 10 11 12 13
3
2
1 32 31 30 29 28 27 26 A8 A9 NC WE OE A10 CE I/O7 I/O6
CE WE COLUMN DECODER OE POWER DOWN
I/O6
6117A
I/O7
A1 A0 NC
A3
A2
A1
A0
6116A-1
I/O0
14 15 16 17 1819 20 GND NC I/O 4 I/O 5 I/O 1 I/O 2 I/O 3
NC
A7
I/O4
V CC
LCC Top View
25 24 23 22 21
I/O
A10
I/O1
I/O2
6116A-4
Selection Guide
Maximum Access Time (ns) Maximum Operating Current (mA) Maximum Standby Current (mA) Commercial Military Commercial Military
D
6116A-20 6117A-20
20 100
6116A-25 6117A-25
40/20
25 100 125 20 40
D
6116A-35 6117A-35
35 100 100 20 20
6116A-45 6117A-45
45 100 100 20 20
6116A-55 6117A-55
55 80 100 20 20
Cypress Semiconductor Corporation
3901 North First Street 1
San Jose
D CA 95134 D 408-943-2600 February 1988 - Revised December 1992
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.) Storage Temperature . . . . . . . . . . . . . . . . . . -65_C to +150_C Ambient Temperature with Power Applied . . . . . . . . . . . . . . . . . . . . . . . -55_C to +125_C Supply Voltage to Ground Potential (Pin 24 to Pin 12) . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V DC Voltage Applied to Outputs in High Z State . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V DC Input Voltage . . . . . . . . . . . . . . . . . . . . . . . -3.0V to +7.0V Output Current into Outputs (LOW) . . . . . . . . . . . . . . 20 mA
Electrical Characteristics
Static Discharge Voltage . . . . . . . . . . . . . . . . . . . . . . . >2001V (per MIL STD 883, Method 3015) Latch Up Current . . . . . . . . . . . . . . . . . . . . . . . . . . . >200 mA
Operating Range
Ambient Range Temperature VCC
Commercial Military[1]
0_C to +70_C -55_C to +125_C
5V 10% 5V 10%
Over the Operating Range[2]
6116A-20 6117A-20 6116A-25, 35, 45 6117A-25, 35, 45 Min. Max. 6116A-55 6117A-55 Min. Max. Unit
Parameter
Description
Test Conditions
Min.
Max.
VOH VOL VIH VIL IIX IOZ IOS ICC
OutputHIGHVoltage VCC = Min., IOH = -4.0 mA Output LOW Voltage VCC = Min., IOL = 8.0 mA Input HIGH Voltage Input LOW Voltage[3] Input Load Current Output Leakage Current Output Short Circuit Current[4] VCC Operating p g S lC Supply Current Automatic CE Power Down Current P D C - TTL Inputs Automatic CE Power Down Current - CMOS Inputs GND < VI < VCC GND < VI < VCC, Output Disabled VCC = Max., VOUT = GND VCC = Max. IOUT = 0 mA A f = fMAX = 1/tRC Max. VCC, CE > VIH f = fMAX Com'l Mil 25 35, 45 Com'l Mil 25 35, 45, 55
2.4 0.4 2.2 -0.5 -10 -10 VCC 0.8 +10 +10 -300 100
2.4 0.4 2.2 -0.5 -10 -10 VCC 0.8 +10 +10 -300 100 125 100 40 20 40 20 20 20 20
2.4 0.4 2.2 -0.5 -10 -10 VCC 0.8 +10 +10 -300 80 100 20 20 20 20
V V V V
mA mA
mA mA
ISB1
mA
ISB2
Max. VCC, Com'l CE > VIH - 0.3V, VIN > VCC - 0.3V or VIN < 0.3V, Mil f=0
mA
Capacitance
[5]
Description Test Conditions Max. Unit
Parameter
CIN COUT
Notes:
Input Capacitance Output Capacitance
TA = 25_C, f = 1 MHz, VCC = 5.0V 5 0V
10 10
pF pF
1. 2. 3.
TA is the instant on" case temperature. See the last page of this specification for Group A subgroup testing in formation. VIL (min.) = -3.0V for pulse durations less than 30 ns.
4. 5.
Not more than 1 output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds. Tested initially and after any design or process changes that may affect these parameters.
2
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
AC Test Loads and Waveforms
5V OUTPUT 30 pF INCLUDING JIG AND SCOPE Equivalent to:
R1 481W
5V OUTPUT 5 pF INCLUDING JIG AND SCOPE
R1 481W 3.0V R2 255W
(b)
R2 255W
(a)
GND
10% 5 ns
ALL INPUT PULSES 90% 90% 10% 5 ns
6116A-6
6116A-5
THEVENIN EQUIVALENT 167W OUTPUT 1.73V
6116A-20 6117A-20 6116A-25 6117A-25 Min. Max. 6116A-35 6117A-35 Min. Max. 6116A-45 6117A-45 Min. Max. 6116A-55 6117A-55 Min. Max.
Switching Characteristics Over the Operating Range[2, 6]
Parameter READ CYCLE
tRC tAA tOHA tACE tDOE tLZOE tHZOE tLZCE tHZCE tPU tPD
Description
Min.
Max.
Unit
Read Cycle Time Address to Data Valid Data Hold from Address Change CE LOW to Data Valid OE LOW to Data Valid OE LOW to Low Z OE HIGH to High Z CE LOW to Low Z
[7]
20 20 5 20 10 3 8 5 8 0 20
25 25 5 25 12 3 10 5 10 0 20
35 35 5 35 15 3 12 5 15 0 20
45 45 5 45 20 3 15 5 15 0 25
55 55 5 55 25 3 20 5 20 0 25
ns ns ns ns ns ns ns ns ns ns ns
[8]
CE HIGH to High Z[7, 8 ] CE LOW to Power Up CE HIGH to Power Down
[9]
WRITE CYCLE
tWC tSCE tAW tHA tSA tPWE tSD tHD tHZWE tLZWE
Write Cycle Time CE LOW to Write End Address Set Up to Write End Address Hold from Write End Address Set Up to Write Start WE Pulse Width Data Set Up to Write End Data Hold from Write End WE LOW to High Z WE HIGH to Low Z
20 15 15 0 0 15 10 0 7 5
20 20 20 0 0 15 10 0 7 5
9.
25 25 25 0 0 20 15 0 10 5
40 30 30 0 0 20 15 0 15 5
50 40 40 0 0 25 25 0 20 5
ns ns ns ns ns ns ns ns ns ns
Notes: 6. Test conditions assume signal transition time of 5 ns or less, timing ref erence levels of 1.5V input pulse levels of 0 to 3.0V and output loading , , of the specified IOL/IOH and 30 pF load capacitance.
7. tHZOE, tHZCE, and tHZWE are specified with CL = 5 pF as in part (b) of AC Test Loads. Transition is measured 500 mV from steady state voltage. At any given temperature and voltage condition, tHZCE is less than tLZCE for any given device.
The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate a write by going HIGH. The data input set up and hold timing should be referenced to the rising edge of the signal that terminates the write.
8.
3
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Switching Waveforms
Read Cycle No. 1[10, 11]
tRC ADDRESS DATA OUT tOHA PREVIOUS DATA VALID tAA DATA VALID
6116A-7
Read Cycle No. 2[10, 12]
CE OE tACE tLZOE HIGH IMPEDANCE tLZCE tPU 50% tDOE
tRC
tHZOE tHZCE DATA VALID tPD 50%
DATA OUT VCC SUPPLY CURRENT
HIGH IMPEDANCE ICC ISB
6116A-8
Write Cycle No. 1 (WE Controlled)[9, 13]
tWC tSCE
ADDRESS CE tSA WE DATA IN DATA I/O
Notes:
10. 11. 12. WE is HIGH for read cycle. Device is continuously selected. OE, CE = VIL. Address valid prior to or coincident with CE transition LOW . 13. Data I/O pins enter high impedance state, as shown, when OE is held LOW during write.
tAW
tPWE tSD DATA VALID tHZWE tHD
tHA
DATA UNDEFINED
tLZWE HIGH IMPEDANCE
6116A-9
4
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Switching Waveforms (continued)
Write Cycle No. 2 (CE Controlled)[9, 13, 14]
tWC ADDRESS tSA CE tAW tPWE WE tHA tSCE
tSD DATA IN DATAIN VALID tHZWE DATA I/O
tHD
HIGH IMPEDANCE DATA UNDEFINED
6116A-10
Note: 14. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high impedance state.
Typical DC and AC Characteristics
NORMALIZED SUPPLY CURRENT vs. SUPPLY VOLTAGE
1.4
SB
OUTPUT SOURCE CURRENT (mA)
NORMALIZED SUPPLY CURRENT vs. AMBIENT TEMPERATURE
1.2
SB
OUTPUT SOURCE CURRENT vs. OUTPUT VOLTAGE
120 100 80 60 40 20 0 0.0 1.0 2.0 3.0 4.0 VCC = 5.0V TA = 25_C
NORMALIZED I CC, I
NORMALIZED I CC, I
1.2 1.0 0.8 0.6 0.4 0.2 0.0 4.0 4.5 5.0 5.5 6.0 ISB ICC
1.0 0.8
ICC
0.6 0.4 0.2 0.0 -55
VCC = 5.0V VIN = 5.0V ISB 25 125
SUPPLY VOLTAGE (V)
AMBIENT TEMPERATURE (_C)
OUTPUT VOLTAGE (V)
NORMALIZED ACCESS TIME vs. SUPPLY VOLTAGE
1.4 1.3 1.2 1.1 TA = 25_C 1.0 1.6
NORMALIZED ACCESS TIME vs. AMBIENT TEMPERATURE
OUTPUT SINK CURRENT (mA) 140 120 100
OUTPUT SINK CURRENT vs. OUTPUT VOLTAGE
NORMALIZED tAA
NORMALIZED tAA
1.4
1.2
VCC = 5.0V 80 60 40 20 0 TA = 25_C
1.0 VCC = 5.0V 0.8
0.9 0.8 4.0
4.5
5.0
5.5
6.0
0.6 -55
25
125
0.0
1.0
2.0
3.0
4.0
SUPPLY VOLTAGE (V)
AMBIENT TEMPERATURE (_C)
OUTPUT VOLTAGE (V)
5
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Typical DC and AC Characteristics (continued)
TYPICAL POWER ON CURRENT vs. SUPPLY VOLTAGE
3.0 2.5 DELTA t AA (ns) 2.0 1.5 1.0 0.5 0.0 0.0 1.0 2.0 3.0 4.0 5.0 30.0 25.0 20.0 15.0 10.0 5.0 0.0
TYPICAL ACCESS TIME CHANGE vs. OUTPUT LOADING
1.4
NORMALIZED ICC vs. CYCLE TIME
VCC = 5.0V NORMALIZED I CC
NORMALIZED I PO
1.3 1.2 1.1 1.0
TA = 25_C VIN = 0.5V
VCC = 4.5V TA = 25_C
0.9 0.8
0
200
400
600
800
1000
0
10
20
30
40
SUPPLY VOLTAGE (V)
CAPACITANCE (pF)
CYCLE FREQUENCY (MHz)
Ordering Information
Speed (ns)
20 25
Ordering Code
CY6116A-20PC CY6116A-25PC CY6116A-25DMB CY6116A-25LMB
Package Name
P11 P11 D12 L64 P11 D12 L64 P11 D12 L64 P11 D12 L64
Package Type
28 Lead (300 Mil) Molded DIP 28 Lead (300 Mil) Molded DIP 24 Lead (600 Mil) CerDIP 28 Square Leadless Chip Carrier 28 Lead (300 Mil) Molded DIP 24 Lead (600 Mil) CerDIP 28 Square Leadless Chip Carrier 28 Lead (300 Mil) Molded DIP 24 Lead (600 Mil) CerDIP 28 Square Leadless Chip Carrier 28 Lead (300 Mil) Molded DIP 24 Lead (600 Mil) CerDIP 28 Square Leadless Chip Carrier
Operating Range
Commercial Commercial Military
35
CY6116A-35PC CY6116A-35DMB CY6116A-35LMB
Commercial Military
45
CY6116A-45PC CY6116A-45DMB CY6116A-45LMB
Commercial Military
55
CY6116A-55PC CY6116A-55DMB CY6116A-55LMB
Commercial Military
Speed (ns)
35 45 55
Ordering Code
CY6117A 35LMB CY6117A 45LMB CY6117A 55LMB
Package Name
L55 L55 L55
Package Type
32 Pin Rectangular Leadless Chip Carrier 32 Pin Rectangular Leadless Chip Carrier 32 Pin Rectangular Leadless Chip Carrier
Operating Range
Military Military Military
6
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
MILITARY SPECIFICATIONS Group A Subgroup Testing DC Characteristics
Parameter Subgroups
VOH VOL VIH VIL Max. IIX IOZ ICC ISB
1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3 1, 2, 3
Switching Characteristics
Parameter READ CYCLE Subgroups
tRC tAA tOHA tACE tDOE tWC tSCE tAW tHA tSA tPWE tSD tHD
7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11 7, 8, 9, 10, 11
WRITE CYCLE
Document #: 38-00105-B
7
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Package Diagrams
24 Lead (600 Mil) CerDIP D12
MIL-STD-1835 D-3 Config. A
32 Pin Rectangular Leadless Chip Carrier L55
MIL-STD-1835 C-12
28 Square Leadless Chip Carrier L64
MIL-STD-1835 C-4
8
6116A: 11/8/89 Revision: Monday, November 8, 1993
CY6116A CY6117A
Package Diagrams (continued)
24 Lead (600 Mil) Molded DIP P11
E
Cypress Semiconductor Corporation, 1992. The information contained herein is subject to change without notice.
Cypress Semiconductor Corporatio n assumes no responsibility for
the use of any circuitry other than circuitry embodied in a Cypress Semiconductor Corporation product. Nor does it convey or imply any license under pa tent or other rights. Cypress Semicon ductor does not authorize its products for use as critical components in life support systems where a malfunction or failure of the product may reason ably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life support systems applications implies that the manufacturer assumes all risk of such use and in so doing indemnifies Cypress Semiconductor against all damages.
9


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